VeEX RXT-6402 Advanced Dual 400G Multi-service Test Module

Advanced 2x400GE Multi-service handheld test set for Lab to Field Applications

VeEX® RXT-6402 is the industry’s most flexible, compact, and future-proof handheld test solution for Core, Metro, Datacenter, and Access applications. The VeEX RXT-6402 Dual 400G offers the flexibility of testing current interfaces and supporting future expandability for applications including Transport, Aggregation, cross-connect, 5G x-haul, and NEMs field support.

The RXT-6400 family has been the leading test solution for portable 400G testing. The RXT-6402 expands its applications and flexibility. Equipped dual test ports to support all common optical transceiver form-factors, AOCs and DACs, this module is a perfect complement to the RXT Platform, extending its testing range to 2×400 Gbps and offering an upgrade path to all-in-one 400GE multi-service testing. Installation, verification, commissioning, evaluation and maintenance tasks are simplified thanks to a combination of intuitive GUI and powerful test functions. Novice users benefit from the easy-to-use GUI, while experienced users will appreciate an array of advanced layer 1-to 4 test features, such as FEC codeword Error distribution analysis, PAM4 pre-emphasis, skew, transceiver check and stress, Lane BERT, Throughput test, IPv4/IPv6 and much more.

As 400GE becomes mainstream, it is important for test equipment to support all test interfaces required to maintain existing legacy infrastructure and data links.

General

2x400GE concurrent testing capabilities
Offers dual ports for all pluggable optics form factors, required for AOC/DAC, fan-out and wrap-around tests (from 10M to 400GE)
Up to four concurrent and independent tests
Native QSFP-DD, QSFP56, SFP-DD, and SFP56 PAM4 hardware for best-in-class signal integrity (no adapters required).
Supports testing for all common form factors, including QSFP-DD, QSFP56, SFP-DD, and SFP56 transceivers, DACs,AOCs, network equipment and 400GE links.
Advanced and flexible state-of-the-art FPGA-based design provides future-proof hardware support for emerging standards, test functions and applications.
Wide range of supported 400GE interfaces, including 400GBASE-SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4 and 400ZR/ZR+.
Complete industry-standard Ethernet link test feature set for Layers 2, 3 and 4.
I2C/MDIO registers Read and Write.
Per-lane PAM4 host pre-emphasis settings.
Signal integrity check with FEC codeword symbol errors distribution and Skew.
Transceivers power consumption monitoring (voltage, current) and variable voltage supply.
Dedicated QSFP-DD head cooling fans (field replaceable) to optimize operating temperature verification of high-power class transceivers, such as ZR/ZR+
All-in-one solution with common legacy test interfaces.
Internal and external (cage) QSFP-DD temperature monitoring with overheating protection.
High-capacity power supply provides support for long range coherent line interface transceivers and 2x400GE applications
Battery (backup) operation improves mobility and efficiency in large hyperscale data centers, nodes, COs, R&D, evaluation labs and other field applications.
High-efficiency intelligent cooling system
Full-feature portable hand-held test set form factor, without compromises.

Applications

Bring-into-service, verification and troubleshooting of high- speed Ethernet links.
Optical transceivers verification.
DAC and AOC verification, requiring full dual port capabilities.
Fan-out tests.
Evaluation labs and field support.
Comprehensive test applications for layers 1-4, from 10M to 400GE.
Full rate 400GE Throughput and frame loss measurements.
PCS & RS-FEC layer testing.
PAM4 signal integrity testing with multi-lane unframed BERT.
I2C/MDIO verification and programming.
Advanced optical transceiver test.
Portable for field testing, evaluations, demonstrations, interop check, benchmarking, troubleshooting, link verification, etc.
Maintenance and troubleshooting of legacy transmission equipment, interfaces and links.
Robust construction and enhanced cooling for field applications.

Test Interfaces

2x QSFP-DD (PAM4)
2x QSFP56/QSFP28/QSFP+ (PAM4/NRZ)
2x SFP-DD/SFP56/SFP28 (PAM4/NRZ)
2x SFP+/SFP (NRZ)
2x RJ45
1x RJ48 and 3x SMA (legacy)
2x Clock Inputs and 2x Outputs
Four independent test port groups

PAM4 Interfaces

Native PAM4 support for 400G QSFP-DD, QSFP56, SFP-DD, SFP56, transceivers.
400GBASE-SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4, and 400ZR/ZR+.
Supports IEEE 802.3bs and MSA compliant transceivers.
300W supply supporting power classes 1 through 8.
Cage temperature monitoring.
QSFP-DD high-temperature warning threshold, overheat protection and field-replaceable external QSFP-DD head cooling system.
Per-lane post and pre-emphasis settings.
Lane BERT with independent test patterns.

MDIO Read/Write

Complete MDIO I2C access.
Raw read/write capability for all MDIO registers.
Formal display of commonly used fields.
Module hardware control pin read/write access.

Optical Power Measurement

Global and per lane output enable/disable.
Received per lane and composite optical power level monitoring.

Transmit Clock Sources

Internal 2.5 ppm VCXO and optional GPS 1PPS.
Recovered: from the incoming signal.
External: 1.544 MHz, 2.048 MHz, 10 MHz, BITS/1.544 Mbps, SETS/2.048 Mbps, and 1PPS via 50 Ohm SMA Connector.

Line Frequency Offset Generation

Line frequency offset generation ±100 ppm in steps of 0.1 ppm.

Line Frequency Measurement Capability

Displays measured transmit line frequency in kHz.
Displays measured transmit line frequency offset from reference clock in current, min, max ppm.
Measures all lanes.

Stress Test: Pre and Post-FEC Test Suite

Simple one button pass/fail test for verifying all transceiver properties.
Advanced user defined thresholds.
Simple test report includes settings, Pass/Fail, and detailed results.
Frequency pulling range stress test.
Pre and Post FEC test.

Advanced Optical Transceiver Test Suite

Pre-FEC BER validation on a per-lane basis, over operational voltage and frequency offset range to verify optical module integrity before FEC is applied to the PAM4 signal (400GE interfaces).
Pre-Framed BER (Lane BERT) validation for non PAM4 interfaces.
Voltage, temperature, and Pre-FEC BER are monitored and displayed for the duration of the test. A histogram function clearly displays all three measurements for easy correlation and tracking of any abnormal changes.
Pre-FEC BER and Optical Power threshold settings for PASS/ FAIL indication.
Pre-emphasis: Pre-taps, post-taps, and attenuation settings for PAM4 signal conditioning on the host side to help verify and stress transceiver tolerance and performance.
Supply Voltage Tolerance Verification: Sweep range from 3.135V to 3.465V (3.300V +/- 5%) to verify compliance with optical transceiver MSA standard.
Power Consumption Verification: Monitors the optical transceiver’s power consumption (Watts), to verify conformance to its specified power class.
Temperature Monitoring: QSFP-DD module and cage temperature monitoring with built-in shutdown protection of the optical module if the temperature increases beyond a certain high temperature.
Frequency Tolerance Verification: Sweep range from -100 ppm to +100pm (in 0.1ppm/step), to verify compliance with the 400GE IEEE 802.3 +/- 20 ppm tolerance specification.
I2C Baud Rate Sweep: QSFP-DD and OSFP sweep range 100K to 4000K. QSFP28 sweep range (20K to 1000K).

For more information: VeEX