Tektronix MSMU60-2 SMU Module
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- 2 SMU channels per module, 6 channels per mainframe
- Up to 60V and up to 1.5 A per channel
- Offers 4-quadrant voltage/current source and measureor each channel with 6½-digit measure resolution down to 100 femtoamps
- Integrated 1 MSa/s ADCs for both voltage and current measurements using fast sample rates
- Up to 6 V between force and sense allowing users more flexibility in cabling and test setup
- User selectable auto-sense resistor prevents excessive voltage at Force Hi if there are contact errors
- Asymmetric Compliance: Configure independent positive and negative limit values
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The Tektronix MP5000 Modular Precision Test System accommodates all your sourcing needs within a 1U rack space. This top-tier automated test equipment (ATE) optimizes rack space by incorporating multiple source measure units (SMUs) and power supplies with adaptable module options. Featuring three slots and dual-channel modules, it offers up to six parallel channels. For higher channel count applications, TSP-Link™ provides a solution to connect mainframes in a master-subordinate configuration, effectively allowing them to function as one unit. This facilitates the creation of an optimized source and measurement system suitable for a wide range of applications, from validating design and debugging to complex parallel test systems used in ATE.
Customers can mix and match module configurations to optimize cost, throughput, and accuracy. For applications where low current measurements and sinking capabilities aren’t required, power supplies can be a cost-effective solution. For applications in which true current sourcing and high-speed measurements are required, consider an SMU module. The system supports a wide array of applications, and its high-density design conserves valuable rack space and reduces cost per channel. It’s engineered to deliver fast throughput for high-channel parallel testing, saving both cost and time for production and validation test users.
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The Tektronix MP5000 Modular Precision Test System accommodates all your sourcing needs within a 1U rack space. This top-tier automated test equipment (ATE) optimizes rack space by incorporating multiple source measure units (SMUs) and power supplies with adaptable module options. Featuring three slots and dual-channel modules, it offers up to six parallel channels. For higher channel count applications, TSP-Link™ provides a solution to connect mainframes in a master-subordinate configuration, effectively allowing them to function as one unit. This facilitates the creation of an optimized source and measurement system suitable for a wide range of applications, from validating design and debugging to complex parallel test systems used in ATE.
Customers can mix and match module configurations to optimize cost, throughput, and accuracy. For applications where low current measurements and sinking capabilities aren’t required, power supplies can be a cost-effective solution. For applications in which true current sourcing and high-speed measurements are required, consider an SMU module. The system supports a wide array of applications, and its high-density design conserves valuable rack space and reduces cost per channel. It’s engineered to deliver fast throughput for high-channel parallel testing, saving both cost and time for production and validation test users.